Title :
Crystallization of SbTe Phase Change Optical Films
Author :
Morales-Sanchez, E. ; Prokhorov, E. ; González-Hernández, J. ; Hernandez-Landaverde, M.A. ; Chao, B.
Author_Institution :
Unidad Queretaro, Queretaro
Abstract :
The aim of this work was to investigate the crystallization properties and crystallization temperature in SbTe thin films, with different content of Sb, using DSC, optical reflection at 650 nm and XRD measurements. DSC studies showed that crystallization temperature of the films depend on the Sb content. XRD measurements have shown that films with low Sb contents (less that 73 at. %) directly crystallized in orthorhombic Sb2nTe3 and films with higher Sb contents first crystallized in rhombohedral Sb phase and at more high temperature appear Sb2nTe3 stable crystalline phase. Optical measurements showed a gradual increase of reflectivity with the temperature depending on the Sb content. The results of this research show that it is possible to obtain mixtures with different crystallization temperatures, changing the Sb content in the SbTe alloys.
Keywords :
X-ray diffraction; amorphous state; antimony alloys; crystallisation; differential scanning calorimetry; light reflection; optical films; phase change materials; reflectivity; tellurium alloys; DSC; SbTe; XRD; amorphous thin films; crystallization; optical reflection; phase change optical films; reflectivity; wavelength 650 nm; Amorphous materials; Crystallization; Optical films; Optical recording; Optical reflection; Phase change memory; Phase measurement; Reflectivity; Temperature dependence; X-ray scattering; DRX; crystallization temperature; thin films;
Conference_Titel :
Electrical and Electronics Engineering, 2007. ICEEE 2007. 4th International Conference on
Conference_Location :
Mexico City
Print_ISBN :
978-1-4244-1166-5
Electronic_ISBN :
978-1-4244-1166-5
DOI :
10.1109/ICEEE.2007.4345035
