Title :
Advanced intelligent mechanical sensors (AIMS)
Author :
Jacobsen, S.C. ; Mladejovsky, M.G. ; Davis, C.C. ; Wood, J.E. ; Wyatt, R.F.
Author_Institution :
Utah Univ., Salt Lake City, UT, USA
Abstract :
A system of integrated, intelligent mechanical transducers, based on the microelectromechanical systems (MEMS) approach, is being developed. The FET-based detectors coexist in the silicon chip with other circuit elements which can amplify, digitize, and multiplex signals produced by detector/emitter interactions. Two transducer types being developed are used as examples: the rotary displacement transducer (RDT) and the uniaxial strain transducer (UAST). By appropriate arrangement of emitter and detector arrays, transducers are being designed to achieve desired tradeoffs between resolution, dynamic range, bandwidth, sensor population size, and other features. With detector and associated circuitry on the same chip, transducers are being designed to implement local intelligence necessary for functions such as self-calibration, correction for subsystems failure, and interaction with adjacent sensors.<>
Keywords :
CMOS integrated circuits; displacement measurement; electric sensing devices; micromechanical devices; pressure transducers; strain measurement; transducers; CMOS IC; FET-based detectors; Si chip; advanced sensors; bandwidth; correction for subsystems failure; detector/emitter interactions; digital sensors; dynamic range; integrated sensors; intelligent mechanical transducers; local intelligence; microelectromechanical systems; path programmable logic; resolution; rotary displacement transducer; self-calibration; sensor population size; uniaxial strain transducer; Circuits; Detectors; Intelligent sensors; Intelligent systems; Mechanical sensors; Microelectromechanical systems; Micromechanical devices; Sensor arrays; Silicon; Transducers;
Conference_Titel :
Solid-State Sensors and Actuators, 1991. Digest of Technical Papers, TRANSDUCERS '91., 1991 International Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-87942-585-7
DOI :
10.1109/SENSOR.1991.149052