A 10 Gbps loss of signal detector for high-speed AC-coupled serial transceivers in 28nm CMOS technology

Author

Kawar, Sanad ; Abugharbieh, Khaldoon ; Al-Akel, Waseem ; Mohammed, M.

Author_Institution

Electr. Eng. Dept., Princess Sumaya Univ. for Technol., Amman, Jordan

fYear

2014

fDate

28-30 May 2014

Firstpage

1

Lastpage

4

Abstract

This paper presents a 10 Gbps loss of signal (LOS) detector for high-speed AC-coupled serial transceivers. The detector is designed in 28nm CMOS and is capable of operating with a 29.5mV internal eye opening and a 67mV external eye opening at the input pads. It consumes 69uW from a 0.9V supply at 10 Gbps and properly asserts an LOS state in 6.8 nsec. A novel comparator topology, which is a part of the LOS circuit, is also presented. It compares a differential input to a differential reference voltage. Design and layout were implemented using Synopsys Custom Designer with 28nm CMOS device models. The LOS detector can reduce power consumption and bit error rate (BER) of serial transceivers.

Keywords

CMOS integrated circuits; comparators (circuits); integrated circuit layout; integrated circuit modelling; signal detection; transceivers; BER; CMOS device models; CMOS technology; LOS circuit; Synopsys custom designer; bit error rate; bit rate 10 Gbit/s; comparator topology; differential input voltage; differential reference voltage; external eye opening; high-speed AC-coupled serial transceivers; internal eye opening; loss of signal detector; power 69 muW; power consumption reduction; size 28 nm; time 6.8 ns; voltage 0.9 V; voltage 29.5 mV; voltage 67 mV; Bit error rate; CMOS integrated circuits; Detectors; Power demand; Receivers; Topology; Transceivers; ACCI; LOS; loss of signal; serial transceivers;

fLanguage

English

Publisher

ieee

Conference_Titel

IC Design & Technology (ICICDT), 2014 IEEE International Conference on

Conference_Location

Austin, TX

Type

conf

DOI

10.1109/ICICDT.2014.6838607

Filename

6838607