• DocumentCode
    1605359
  • Title

    Further Results on Optimum Selection Diversity for BPSK Signals in Nakagami-m Fading

  • Author

    Annamalai, A. ; Zhao, Qiang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Prairie View A&M Univ., Prairie View, TX, USA
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This article develops a mathematical framework for analyzing the average bit error rate (ABER) performance of four different selection diversity combining (SDC) schemes over slow, frequency non-selective Nakagami-m fading channels. Aside from the traditional SDC, generalized selection combining (¿-GSC) and ´maximum matched filter output´ selection methods, two new selection rules based on choosing the branch providing the largest magnitude of log-likelihood ratio (LLR) for binary phase shift keying signals (with and without phase compensation in the selection process) are also investigated. The new framework is sufficiently general to examine the effects of dissimilar fading parameters and unequal mean received signal strengths across the diversity paths. The accuracies of our analytical expressions have been validated via Monte Carlo simulation.
  • Keywords
    Monte Carlo methods; Nakagami channels; diversity reception; error statistics; filtering theory; matched filters; phase shift keying; BPSK signal; Monte Carlo simulation; Nakagami-m fading channel; average bit error rate; binary phase shift keying signal; diversity path; fading parameter; generalized selection combining; log-likelihood ratio; maximum matched filter output selection; optimum selection diversity; phase compensation; selection diversity combining; unequal mean received signal strength; Binary phase shift keying; Diversity methods; Diversity reception; Fading; Land mobile radio; Matched filters; Receivers; Signal to noise ratio; Statistical distributions; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Communications and Networking Conference (CCNC), 2010 7th IEEE
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    978-1-4244-5175-3
  • Electronic_ISBN
    978-1-4244-5176-0
  • Type

    conf

  • DOI
    10.1109/CCNC.2010.5421626
  • Filename
    5421626