Title :
Temperature-dependent leakage mechanisms of BiFeO3 films
Author :
Yang, H. ; Jain, M. ; Zhou, H. ; Luo, H.M. ; Jia, Q.X.
Author_Institution :
Superconductivity Technology Center, Materials Physics and Applications Division, Los Alamos National Laboratory, USA
Abstract :
Epitaxial c-axis oriented BiFeO3 (BFO) thin films were deposited on conductive SrRuO3 (SRO) on (001) SrTiO3 substrates by pulsed laser deposition. A Pt/BFO/SRO capacitor was constructed by depositing a top Pt electrode. The leakage current density vs. electric field characteristics were investigated from 80 to 350 K. It was found that the leakage mechanisms were a strong function of temperature and voltage polarity. At temperatures between 80 and 150 K, space-charge-limited current was the dominant leakage mechanism for both negative and positive bias. On the other hand, at temperatures between 200 and 350 K the dominant leakage mechanisms were Poole-Frenkle emission and Fowler-Nordheim tunneling for negative and positive bias, respectively.
Keywords :
Capacitors; Conductive films; Electrodes; Leakage current; Optical pulses; Pulsed laser deposition; Sputtering; Substrates; Temperature; Voltage;
Conference_Titel :
Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
Conference_Location :
Santa Re, NM, USA
Print_ISBN :
978-1-4244-2744-4
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2008.4693776
