• DocumentCode
    1605911
  • Title

    Data standards: the link between design and test

  • Author

    Hanna, James P.

  • Author_Institution
    Rome Lab., Griffiss AFB, NY, USA
  • fYear
    1992
  • Firstpage
    57
  • Lastpage
    62
  • Abstract
    The author discusses the design to test data representations that are being developed by Rome Laboratory in concert with representatives of the computer aided design/test (CAD/CAT) industry and various US Department of Defense and government agencies under the auspices of the IEEE. Few standard representations of engineering, design, and test information exist to foster exchange and reuse in any reasonable fashion during the process of developing and fielding electronic systems. One problem is that the data generated by one vendor´s tool cannot be readily used by the tools of another vendor. Another problem is that no integrated solution exists to address the complete spectrum of engineering, design, and test activities. Three industry standard data representations that are in various stages of development are presented, and their potential impact on the problem domain is examined.<>
  • Keywords
    CAD; automatic test equipment; automatic testing; design for testability; electronic data interchange; electronic engineering computing; military computing; standards; CAD/CAT; IEEE; Rome Laboratory; US Department of Defense; computer aided design/test; data standards; electronic systems; industry standard data representations; test data representations; Automatic testing; Circuit testing; Costs; Design automation; Design engineering; Electronic equipment testing; Laboratories; Microelectronics; Standards development; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '92. IEEE Systems Readiness Technology Conference, Conference Record
  • Conference_Location
    Dayton, OH, USA
  • Print_ISBN
    0-7803-0643-0
  • Type

    conf

  • DOI
    10.1109/AUTEST.1992.270133
  • Filename
    270133