Title :
Test and diagnostics product data representation
Author :
Fortier, Stephen C. ; Wilmot, Andrew
Author_Institution :
Intermetrics Inc., McLean, VA, USA
Abstract :
The Product Data Exchange using the Standard for the Exchange of Product Model Data (PDES/STEP) Application Protocols for Electronics program will develop application protocols for communicating information between activities within the electronic life cycle. The program, abbreviated as PAP-E, will develop application protocols (APs) in accordance with the PDES/STEP development philosophy. Information modeling during the application protocol development process is an integral part of this philosophy. The project will include a demonstration of a selected portion of the developed APs representing test and integrated diagnostics information. A pilot AP development activity being conducted is described.<>
Keywords :
CAD/CAM; automatic test equipment; electronic data interchange; electronic engineering computing; manufacturing data processing; protocols; standards; PAP-E; PDES/STEP; Product Data Exchange; application protocols; electronic life cycle; information modelling; integrated diagnostics; Active appearance model; Application software; Computer industry; Context modeling; Databases; Government; Life testing; Performance evaluation; Protocols; Standards development;
Conference_Titel :
AUTOTESTCON '92. IEEE Systems Readiness Technology Conference, Conference Record
Conference_Location :
Dayton, OH, USA
Print_ISBN :
0-7803-0643-0
DOI :
10.1109/AUTEST.1992.270135
