Title :
NA008 Deposition temperature dependence of YBCO transport properties
Author :
Wang, J. ; Kwon, J. ; Yoon, J. ; Wang, H. ; Haugan, T.J. ; Baca, F.J. ; Pierce, N.A. ; Barnes, P.N.
Author_Institution :
Department of Electrical and Computer Engineering, Texas A&M University, College Station, 77843-3128, USA
Abstract :
In this paper, we report a strong correlation between the stacking fault (SF) density and the critical current density of YBa2Cu3O7???? (YBCO) thin films in applied field (Jcin-field). We found that the Jcin-field increases as the deposition temperature increases (775??C ?? 825??C) for the samples grown on both SrTiO3 (STO) and LaAlO3 substrates. An interesting linear relation is observed between the SF density and the Jcin-field value, which suggests that the YBCO SF density plays an important role in the YBCO in-field transport performance.
Keywords :
Critical current density; Laser theory; Laser transitions; Magnetic field measurement; Pulsed laser deposition; Stacking; Superconducting cables; Superconducting transition temperature; Temperature dependence; Yttrium barium copper oxide;
Conference_Titel :
Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
Conference_Location :
Santa Re, NM, USA
Print_ISBN :
978-1-4244-2744-4
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2008.4693798
