• DocumentCode
    1606214
  • Title

    Improvements in dielectric measurements with a resonant cavity

  • Author

    Estin, Arthur J. ; Janezic, Michael D.

  • Author_Institution
    CyberLink Corp., Boulder, CO, USA
  • fYear
    1991
  • Firstpage
    573
  • Lastpage
    579
  • Abstract
    A description is given of the use of an automatic network analyzer (ANA) which determines with very high accuracy the resonant frequency and intrinsic quality factor of a microwave resonant cavity. With this technique, the complex permittivity of dielectric material samples can be measured with low uncertainty. The methods described make use of the high speed and built-in mismatch correction capability of an ANA
  • Keywords
    Q-factor measurement; cavity resonators; frequency measurement; microwave measurement; network analysers; permittivity measurement; Q-factor; automatic network analyzer; built-in mismatch correction; complex permittivity; dielectric material; dielectric measurements; intrinsic quality factor; microwave measurement; microwave resonant cavity; resonant frequency; skin depth; Calibration; Chromium; Dielectric materials; Dielectric measurements; Paper technology; Permittivity; Q factor; Reflection; Resonance; Resonant frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-87942-579-2
  • Type

    conf

  • DOI
    10.1109/IMTC.1991.161660
  • Filename
    161660