Title :
Improvements in dielectric measurements with a resonant cavity
Author :
Estin, Arthur J. ; Janezic, Michael D.
Author_Institution :
CyberLink Corp., Boulder, CO, USA
Abstract :
A description is given of the use of an automatic network analyzer (ANA) which determines with very high accuracy the resonant frequency and intrinsic quality factor of a microwave resonant cavity. With this technique, the complex permittivity of dielectric material samples can be measured with low uncertainty. The methods described make use of the high speed and built-in mismatch correction capability of an ANA
Keywords :
Q-factor measurement; cavity resonators; frequency measurement; microwave measurement; network analysers; permittivity measurement; Q-factor; automatic network analyzer; built-in mismatch correction; complex permittivity; dielectric material; dielectric measurements; intrinsic quality factor; microwave measurement; microwave resonant cavity; resonant frequency; skin depth; Calibration; Chromium; Dielectric materials; Dielectric measurements; Paper technology; Permittivity; Q factor; Reflection; Resonance; Resonant frequency;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
0-87942-579-2
DOI :
10.1109/IMTC.1991.161660
