• DocumentCode
    1606481
  • Title

    Automatic error pattern generation for design error detection in a design validation simulation system

  • Author

    Kang, Sungho ; Szygenda, Stephen A.

  • Author_Institution
    Comput. Eng. Res. Center, Austin, TX, USA
  • fYear
    1992
  • Firstpage
    533
  • Lastpage
    536
  • Abstract
    Considering the fact that simulation patterns can detect a different number of design errors, the derivation of efficient simulation patterns is important. Automatic error pattern generation is introduced to generate a set of error simulation pattern which can be used as input stimuli for design error simulation, a design validation tool which provides a measure of simulation coverage. These tools provide a solution to a long standing problem that has limited design options and design cycle time. They also can decrease design and testing costs
  • Keywords
    automatic testing; digital simulation; integrated circuit testing; logic testing; design cycle time; design error detection; design errors; design validation simulation system; design validation tool; error pattern generation; input stimuli; simulation coverage; simulation patterns; Analytical models; Automatic test pattern generation; Circuit faults; Circuit simulation; Computational modeling; Computer errors; Computer simulation; Design engineering; Pattern analysis; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC Conference and Exhibit, 1992., Proceedings of Fifth Annual IEEE International
  • Conference_Location
    Rochester, NY
  • Print_ISBN
    0-7803-0768-2
  • Type

    conf

  • DOI
    10.1109/ASIC.1992.270205
  • Filename
    270205