• DocumentCode
    1606768
  • Title

    Redundancy in topology errors detection and identification

  • Author

    Vuong, Mai-Hoa ; Lefebvre, Serge ; Lagacé, Pierre-Jean

  • Author_Institution
    Dept. of Electr. Eng., Quebec Univ., Montreal, Que., Canada
  • Volume
    3
  • fYear
    2004
  • Firstpage
    1494
  • Abstract
    Without redundancy of independent measurements, detection and thus identification of gross errors are impossible. Lack of redundancy forces the use of pseudo-measurements, as a consequence the state estimator solution is deteriorated. Therefore, the redundancy level of the measurement system is an evolving concept that can be used to guide the reinforcement of measurement systems to enhance the efficiency of error detection methods. Topology error results in wrong network configuration of the model used. In this paper, the errors treated are a line that is out of service and still connected to the model, or vice-versa. The method proposed in the paper is aimed at determining redundant and good pseudo-measurement emplacements to enhance reliability of detection and identification of topology error. The basic process was developed earlier by the authors. The algorithm requires one line flow and one power injection by loop. Its effectiveness is related to the low number of redundant measurement and the systematic selection of their location as well as that of pseudo-measurements. Test results are presented.
  • Keywords
    error detection; measurement errors; network topology; redundancy; state estimation; error detection methods; line flow; measurement system; power injection; pseudo-measurements; redundant measurement; topology errors detection; topology errors identification; Engineering management; Error analysis; Error correction; Intelligent networks; Network topology; Power system modeling; Power system reliability; Redundancy; State estimation; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Technology, 2004. IEEE ICIT '04. 2004 IEEE International Conference on
  • Print_ISBN
    0-7803-8662-0
  • Type

    conf

  • DOI
    10.1109/ICIT.2004.1490785
  • Filename
    1490785