Title :
Transient response testing of mixed-signal ASICs
Author :
Taylor, D. ; Evans, P.S.A. ; Pritchard, T.I.
Author_Institution :
Sch. of Eng., Huddersfield Polytech., UK
Abstract :
Problems associated with testing mixed-signal (mixed analog and digital) ASICs are reviewed, and transient response analysis is justified as a test technique for the analog cells embedded in these devices. Fault simulations for assessing the fault coverage of the technique in a mixed-signal cell library are compared with the results obtained in testing device samples exhibiting a range of cell defects
Keywords :
integrated circuit testing; mixed analogue-digital integrated circuits; transient response; embedded analog cells; fault coverage; fault simulation; mixed-signal ASICs; mixed-signal cell library; testing; transient response analysis; Application specific integrated circuits; Circuit faults; Circuit simulation; Circuit testing; Digital signal processing; Impulse testing; Logic testing; System testing; Transient analysis; Transient response;
Conference_Titel :
ASIC Conference and Exhibit, 1992., Proceedings of Fifth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-0768-2
DOI :
10.1109/ASIC.1992.270219
