Correlation between electro-optical coefficient and dielectric permittivity of BST thin films

Author

Takeda, K. ; Muraishi, T. ; Hoshina, T. ; Kakemoto, H. ; Tsurumi, T.

Author_Institution

Department of Metallurgy and Ceramics Science, Graduate School of Science and Engineering, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, 152-8552, Japan

Volume

3

fYear

2008

Firstpage

1

Lastpage

2

Abstract

A new measurement system of electro-optical (EO) effect and dielectric permittivity (??r) was developed to investigate the correlation between electro-optic and dielectric properties of epitaxial barium strontium titanate, Ba1-??Sr??TiO3 (BST) thin films grown on SrTiO3 (STO) substrates. The refractive index (birefringence) and the permittivity were measured as a function of DC-bias field applied using a planer electrode on the films. It was found that the tunability of birefringence was much lower than that of dielectric permittivity. The difference in the tunability was discussed from the view point polarization mechanisms.

Keywords

Barium; Binary search trees; Birefringence; Dielectric measurements; Dielectric substrates; Dielectric thin films; Electrooptic effects; Permittivity measurement; Strontium; Titanium compounds;

fLanguage

English

Publisher

ieee

Conference_Titel

Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the

Conference_Location

Santa Re, NM, USA

ISSN

1099-4734

Print_ISBN

978-1-4244-2744-4

Electronic_ISBN

1099-4734

Type

conf

DOI

10.1109/ISAF.2008.4693845

Filename

4693845