DocumentCode :
1607464
Title :
Structure and dielectric properties of (Sr1-1.5xBix)TiO3 thin films
Author :
Shi, Peng ; Ren, Wei ; Zhao, Min ; Wei, Xiaoyong ; Wu, Xiaoqing ; Chen, Xiaofeng ; Yao, Xi
Author_Institution :
Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education, Xi¿an Jiaotong University, 710049, China
Volume :
3
fYear :
2008
Firstpage :
1
Lastpage :
2
Abstract :
Bismuth doped SrTiO3 material has shown very interesting phenomena. Dielectric and ferroelectric relaxations have been recently reported in bismuth doped SrTiO3 ceramics in the lower temperature range [1]. Moreover, several dielectric anomalies with temperature ranges were observed [2]. The anomalies phenomena may be contributed by the formation of several kinds of polar clusters after introducing bismuth in SrTiO3. Bi-doped SrTiO3 is emerging as a promising material for microwave tunable devices [3].
Keywords :
Dielectric thin films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
Conference_Location :
Santa Re, NM, USA
ISSN :
1099-4734
Print_ISBN :
978-1-4244-2744-4
Electronic_ISBN :
1099-4734
Type :
conf
DOI :
10.1109/ISAF.2008.4693858
Filename :
4693858
Link To Document :
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