• DocumentCode
    1608030
  • Title

    Life-time test of laser and reflow soldered flexible substrates

  • Author

    Batorfi, Reka ; Illyefalvi-Vitez, Zsolt

  • Author_Institution
    Dept. of Electron. Technol., Budapest Univ. of Technol. & Econ. (BME), Budapest, Hungary
  • fYear
    2008
  • Firstpage
    61
  • Lastpage
    66
  • Abstract
    We examined the quality and the reliability of lead-free solder joints which were made with a selective laser soldering process. The three types of applied substrate materials - polyimide (PI), a kind of polyester (PET) and polyethylene-naphtalate (PEN) - withstood the local heat dose even if the allowed temperature limits of them were lower than the melting points of the applied solders. We used substrates with different adhesives and cover layers. The two types of solder pastes were SnBi and SnAgCu (SAC) alloys. Altogether 16 solder-substrate-adhesive combinations were tested and compared to similar reflow soldered combinations when the implementation of the technology was possible. The testboards were submitted to HAST (highly accelerated stress test) and the degradation was monitored. Optical inspection and shear force measurements were used for comparative analyses. As a result, the combinations were put in order on the basis of these data. With these achievements; the processing, materials, product performance and reliability could be improved.
  • Keywords
    adhesives; alloys; lasers; soldering; substrates; SnAgCu; SnBi; adhesives; applied substrate materials; highly accelerated stress test; laser life-time test; lead-free solder joints; optical inspection; polyester; polyethylene-naphtalate; polyimide; selective laser soldering; shear force measurements; solder pastes; solder-substrate-adhesive combinations; soldered flexible substrates; Environmentally friendly manufacturing techniques; Lead; Life estimation; Life testing; Optical materials; Polyimides; Positron emission tomography; Soldering; Stress; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology, 2008. ISSE '08. 31st International Spring Seminar on
  • Conference_Location
    Budapest
  • Print_ISBN
    978-1-4244-3972-0
  • Electronic_ISBN
    978-1-4244-3974-4
  • Type

    conf

  • DOI
    10.1109/ISSE.2008.5276463
  • Filename
    5276463