• DocumentCode
    1608058
  • Title

    Dynamic response of the ITER diagnostic upper port plug during a plasma disruption

  • Author

    Pak, S. ; Udintsev, V. ; Maquet, Ph ; Pitcher, C.S. ; Cheon, M.S. ; Seon, C.R. ; Lee, H.G.

  • Author_Institution
    Nat. Fusion Res. Inst., Daejeon, South Korea
  • fYear
    2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The diagnostic upper port plug in ITER is a long metal box cantilevered to the vacuum vessel port with 42 × M52 studs and nuts. The plug structure has a heavy payload at the front such as the Diagnostic First Wall (DFW) and the Diagnostic Shield Module (DSM) to protect the diagnostic components from plasma and neutron fluxes. This kind of structural configuration is susceptible to a resonance with the transient external load. For the upper port plug, the design-driving load is electromagnetic (EM) forces due to plasma disruptions. In this study the dynamic amplification factor (DAF) of the structure is calculated for such EM loads. The bolted joint at the back flange of the plug structure is also taken into account together with the port extension of the vacuum vessel and its influence on the dynamic behavior is investigated. The analysis results show that the bolted joint reduces the DAF as well as the natural frequency of the structure.
  • Keywords
    Tokamak devices; fusion reactor design; plasma diagnostics; plasma instability; plasma toroidal confinement; plasma-wall interactions; ITER diagnostic upper port plug dynamic response; design-driving load; diagnostic first wall; diagnostic shield module; dynamic amplification factor; electromagnetic forces; neutron flux; plasma disruption; plasma flux; plug structure back flange; transient external load; vacuum vessel port; Analytical models; Dynamics; Joints; Plasmas; Plugs; Ports (Computers); Transient analysis; ITER; dynamic amplification factor; electromagnetic loads; upper port plug;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fusion Engineering (SOFE), 2013 IEEE 25th Symposium on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4799-0169-2
  • Type

    conf

  • DOI
    10.1109/SOFE.2013.6635469
  • Filename
    6635469