Title :
A maximum likelihood OFDM receiver with smoothed FFT-window for large multipath delay difference over the guard interval
Author :
Suyama, Satoshi ; Hara, Yoshitaka ; Suzuki, Hiroshi ; Kamio, Yukiyoshi ; Fukawa, Kazuhiko
Author_Institution :
Tokyo Inst. of Technol., Japan
fDate :
6/24/1905 12:00:00 AM
Abstract :
This paper proposes a new maximum likelihood OFDM receiver for multipath fading environment with large delay spread. The large delay difference over the guard interval (GI) duration of the OFDM signal generally results in intersymbol interference (ISI) between temporally adjacent symbols and interchannel interference (ICI). Both of them spread over a large number of subcarriers. The new OFDM receiver consists of equalizers for both ISI and ICI and an accurate channel impulse response estimator. Furthermore, it introduces a temporal-window technique for the FFT-window in order to suppress the ICI, which is very effective for reducing the complexity of ICI equalization by maximum likelihood sequence estimator (MLSE). Computer simulation is conducted in order to verify the performance of the proposed OFDM receiver, and its effectiveness is shown.
Keywords :
OFDM modulation; adjacent channel interference; delay estimation; equalisers; fading channels; fast Fourier transforms; interference suppression; intersymbol interference; maximum likelihood sequence estimation; mobile radio; multipath channels; radio receivers; transient response; FFT window; ICI; ICI suppression; ISI; MLSE; OFDM; channel impulse response estimator; complexity reduction; delay spread; equalizers; guard interval duration; interchannel interference; intersymbol interference; maximum likelihood sequence estimator; mobile communication systems; multipath fading; performance; receiver; temporal window technique; Decision feedback equalizers; Degradation; Delay; Fading; Interchannel interference; Intersymbol interference; Maximum likelihood estimation; OFDM modulation; Transmitters; Wireless LAN;
Conference_Titel :
Vehicular Technology Conference, 2002. VTC Spring 2002. IEEE 55th
Print_ISBN :
0-7803-7484-3
DOI :
10.1109/VTC.2002.1002814