Title :
A new simple adaptive phase tracking scheme employing phase noise estimation for OFDM signals
Author :
Onizawa, Takeshi ; Mizoguchi, Masato ; Sakata, Tetsu ; Morikura, Masahiro
Author_Institution :
NTT Access Network Service Syst. Labs., NTT Corp., Kanagawa, Japan
fDate :
6/24/1905 12:00:00 AM
Abstract :
An adaptive phase tracking scheme for orthogonal frequency division multiplexing (OFDM) signals can provide superior PER performance in channels that exhibit a variety of phase noise power. It is an effective technique with which to achieve high-rate and high quality wireless transmission. This paper proposes a new simple adaptive phase tracking scheme for OFDM in order to realize high-rate wireless local area networks (LANs). The proposed scheme measures the integrated phase rotation in order to set appropriately the properties of the FIR filter in the phase tracking circuits. This scheme is based on the fact that the integrated phase rotation is correlated to the phase noise power. Assuming an RMS delay spread of 100 ns, computer simulations show that the proposed scheme offers superior required Eb/N0 performance (versus the phase noise power) compared to the conventional fixed-tap scheme, where the phase-noise-to-signal power ratios are lower than -18 dB. It also offers excellent PER performance at the packet length of 1000 bytes, unlike the conventional schemes which suffer degraded PER performance.
Keywords :
FIR filters; OFDM modulation; adaptive signal processing; error statistics; packet radio networks; parameter estimation; phase noise; wireless LAN; 100 ns; FIR filter; OFDM signals; adaptive phase tracking; data communication; delay spread; orthogonal frequency division multiplexing; phase noise estimation; wireless LAN; wireless local area networks; Computer simulation; Delay; Finite impulse response filter; Integrated circuit measurements; OFDM; Phase estimation; Phase measurement; Phase noise; Rotation measurement; Wireless LAN;
Conference_Titel :
Vehicular Technology Conference, 2002. VTC Spring 2002. IEEE 55th
Print_ISBN :
0-7803-7484-3
DOI :
10.1109/VTC.2002.1002815