• DocumentCode
    1608229
  • Title

    Synthesis and characterization of vanadium doped SrBi2Nb2O9 ferroelectric ceramics

  • Author

    Jain, Sameer ; Ganguly, Prasun ; Jha, A.K.

  • Author_Institution
    Thin Film and Materials Science Laboratory, Dept. of Applied Physics, Delhi College of Engineering - 110042, India
  • Volume
    1
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Samples of compositions SrBi2VxNb2??xO9, x = 0.0, 0.1, 0.3, 0.5 were prepared by solid-state reaction technique using high purity oxides/carbonates. The samples were calcined at 700??C and sintered at 900??C. XRD diffractograms show that a single phase layered perovskite structure is formed in all the samples. Effect of partial substitution of pentavalent niobium ion (0.68A??) by smaller pentavalent vanadium ion ( 0.59A??) at B site on the microstructural, Curie temperature, dielectric constant and dielectric loss have been investigated. Partial substitution of Nb5+ by V5+ is observed to have a profound effect. Dielectric properties of SBVN were investigated from room temperature to 500 ??C and frequency of 100 Hz to 1 MHz. Dielectric constant values at their respective Curie points are observed to increase with increasing vanadium concentration. An overall increase in Curie temperature is also observed with increasing vanadium concentration. Strong relaxor like dielectric relaxation at the transition temperature have been observed. With increasing vanadium concentration the dielectric loss is observed to increase significantly. It is also observed that dielectric loss increases with increase in temperature.
  • Keywords
    Ceramics; Dielectric constant; Dielectric losses; Diffraction; Ferroelectric materials; Frequency; Niobium; Solid state circuits; Temperature; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
  • Conference_Location
    Santa Re, NM, USA
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-2744-4
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2008.4693891
  • Filename
    4693891