BICS-based March test for resistive-open defect detection in SRAMs

Nowadays, embedded Static Random Memories (SRAMs) can occupy a significant portion of the chip area and contain hundreds of millions of transistors. Due to technology scaling, functional fault models traditionally applied in SRAMs´ testing have become insufficient to correctly reproduce the effects caused by some defects generated during the manufacturing process. In this paper, we investigate the possibility to use Built-In Current Sensors (BICSs) in combination with an optimized March algorithm to detect static faults associated to resistive-open defects. Experimental results obtained throughout electrical simulations validate the proposed technique demonstrating its viability and effectiveness.