DocumentCode
1608555
Title
Automatic generation of a parameter-domain-based functional input coverage model
Author
Castro, Carlos Ivan ; Strum, Marius ; Chau, Jiang
Author_Institution
Dept. of Electron. Syst., Univ. of Sao Paulo, Sao Paulo, Brazil
fYear
2010
Firstpage
1
Lastpage
6
Abstract
IP cores, which are usually described in the RT level, must be thoroughly verified so as not to allow design bugs to inadvertently propagate throughout the system. As the mainstream technique, simulation-based functional verification avoids the state-space explosion issues commonly present in formal verification methodologies. However, since RTL cycle-accurate simulation is relatively slow, the amount of random testing must be limited by completion and sufficiency metrics, identified as the coverage model. The coverage model may be developed after the constrained random stimuli set has been defined, as in a traditional verification flow, or developed before, as in coverage-driven verification. Both approaches make it clear that functional coverage is not a well defined object, whose construction lacks formalism. In the present paper, we propose a strategy to design functional input coverage models on the basis of the PD formalism, by which non-valid input stimuli become evident. Results show that, in contrast to uniform coverage models, PD-coherent coverage models reduce significantly the amount of stimuli wasted on coverage events that, although fulfilled, keep receiving item hits disregarding other less-favored events. Shorter simulation times are achieved for equivalent designs, testbenches, and parameter domains. Also, it can be demonstrated that, as data collected during simulation fits strongly with stimuli generation and functional coverage, it provides information that is easier to interpret, and allows analyzing the DUV´s behavior with a relatively higher consistency level.
Keywords
automatic test pattern generation; industrial property; systems analysis; automatic generation; functional verification; parameter-domain-based functional input coverage model; random testing; Aerospace electronics; Correlation; Generators; Magnetic cores; Measurement; Payloads; Testing; Coverage Models; Functional Coverage; Functional Verification; Intellectual Property; Parameter Domains;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Workshop (LATW), 2010 11th Latin American
Conference_Location
Pule del Este
Print_ISBN
978-1-4244-7786-9
Electronic_ISBN
978-1-4244-7785-2
Type
conf
DOI
10.1109/LATW.2010.5550344
Filename
5550344
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