DocumentCode
1608717
Title
Time-resolved characterization of domain switching in ferroelectrics using X-ray and neutron diffraction
Author
Jones, J.L. ; Pramanick, A. ; Daniels, J.E.
Author_Institution
Department of Materials Science and Engineering, University of Florida, PO Box 116400, Gainesville, 32611-6400, USA
Volume
1
fYear
2008
Firstpage
1
Lastpage
2
Abstract
Diffraction provides an effective means to characterize ferroelectric materials under dynamic loading conditions. This paper describes a typical time-resolved diffraction setup and one example of a time-dependent strain response to an applied electric field in a piezoelectric lead zirconate titanate (PZT) ceramic.
Keywords
Capacitive sensors; Ceramics; Electric variables measurement; Ferroelectric materials; Lattices; Neutrons; Reflection; Strain measurement; Time measurement; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
Conference_Location
Santa Re, NM, USA
ISSN
1099-4734
Print_ISBN
978-1-4244-2744-4
Electronic_ISBN
1099-4734
Type
conf
DOI
10.1109/ISAF.2008.4693913
Filename
4693913
Link To Document