• DocumentCode
    1608840
  • Title

    Life-time of lead-free soldered SMT joints

  • Author

    Szwech, M. ; Drozd, Z.

  • Author_Institution
    Div. of Precision & Electron. Product Technol., Warsaw Univ. of Technol., Warsaw, Poland
  • fYear
    2008
  • Firstpage
    17
  • Lastpage
    21
  • Abstract
    The work concern the life-time of electronic products according to ROHS Directive of European Community. Methods and results of accelerated mechanical and thermal cycling fatigue tests of SnPb and lead-free solder joints, realized in GreenRoSE EC Project are described. The aim of the work is development of cheap test methods, applicable by small producers of electronic equipment. Thermal shock cycling method and mechanical method of cycling bending of PCB samples with soldered SMT and BGA components were applied. The investigations showed the possibility of simplified reliability assessment of lead-free electronic products by mechanical fatigue testing. Advantage of this method is lower cost and shorter test time as by thermal cycling. The planes of further research for obtaining more detailed data are discussed.
  • Keywords
    IV-VI semiconductors; fatigue testing; mechanical testing; printed circuit testing; reliability; solders; surface mount technology; tin compounds; GreenRoSE EC Project; PCB sample; ROHS Directive of European Community; SnPb; accelerated mechanical test; electronic product life-time; lead-free soldered SMT joint; surface mount technology; thermal cycling fatigue test; thermal shock cycling method; Costs; Electric shock; Electronic equipment; Electronic equipment testing; Environmentally friendly manufacturing techniques; Fatigue; Lead; Life estimation; Soldering; Surface-mount technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology, 2008. ISSE '08. 31st International Spring Seminar on
  • Conference_Location
    Budapest
  • Print_ISBN
    978-1-4244-3972-0
  • Electronic_ISBN
    978-1-4244-3974-4
  • Type

    conf

  • DOI
    10.1109/ISSE.2008.5276493
  • Filename
    5276493