Title :
Application of redundant basis elements to increase self-timedcircuits reliability
Author :
Kamenskih, Anton N. ; Tyurin, Sergey F.
Author_Institution :
Dept. of Autom. & Remote control, Perm Nat. Res. Polytech. Univ., Perm, Russia
Abstract :
Self-timed circuits are considered in the article in terms of their reliability. A brief description of strictly self-timed functionally complete tolerant element is given. Validity of a functionally complete tolerant element is calculated. Calculation is based on single stuck-at faults model. Electric structural diagram of strictly self-timed device is also analyzed. Switching element is proposed for duplicating of self-timed circuits. Control unit verbal model is proposed for self-timed circuits.
Keywords :
circuit diagrams; circuit reliability; fault tolerance; control unit verbal model; electric structural diagram; functionally complete tolerant element; redundant basis elements; self-timed circuits reliability; single stuck-at faults model; strictly self-timed device; switching element; Automation; CMOS integrated circuits; Circuit faults; Finite element analysis; Integrated circuit reliability; Switching circuits; functional complete tolerant element (FCT); redundant basis; reliability; strictly self-timed circuits (SST); validity of operation;
Conference_Titel :
Electrical and Electronic Engineering Conference (ElConRusNW), Proceedings of the 2014 IEEE NW Russia Young Researchers in
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4799-2593-3
DOI :
10.1109/ElConRusNW.2014.6839198
