Application of redundant basis elements to increase self-timedcircuits reliability

Author

Kamenskih, Anton N. ; Tyurin, Sergey F.

Author_Institution

Dept. of Autom. & Remote control, Perm Nat. Res. Polytech. Univ., Perm, Russia

fYear

2014

fDate

3-5 Feb. 2014

Firstpage

47

Lastpage

50

Abstract

Self-timed circuits are considered in the article in terms of their reliability. A brief description of strictly self-timed functionally complete tolerant element is given. Validity of a functionally complete tolerant element is calculated. Calculation is based on single stuck-at faults model. Electric structural diagram of strictly self-timed device is also analyzed. Switching element is proposed for duplicating of self-timed circuits. Control unit verbal model is proposed for self-timed circuits.

Keywords

circuit diagrams; circuit reliability; fault tolerance; control unit verbal model; electric structural diagram; functionally complete tolerant element; redundant basis elements; self-timed circuits reliability; single stuck-at faults model; strictly self-timed device; switching element; Automation; CMOS integrated circuits; Circuit faults; Finite element analysis; Integrated circuit reliability; Switching circuits; functional complete tolerant element (FCT); redundant basis; reliability; strictly self-timed circuits (SST); validity of operation;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical and Electronic Engineering Conference (ElConRusNW), Proceedings of the 2014 IEEE NW Russia Young Researchers in

Conference_Location

St. Petersburg

Print_ISBN

978-1-4799-2593-3

Type

conf

DOI

10.1109/ElConRusNW.2014.6839198

Filename

6839198