Title :
Electrical Impedance Tomography Based on Sensitivity Theorem with Singular Value Decomposition
Author :
Yan, Peimin ; Wang, Shuozhong ; Shi, Luming
Author_Institution :
Sch. of Commun., Shanghai Univ.
Abstract :
In electrical impedance tomography (EIT), distribution of internal resistivity of an unknown object is estimated using measured boundary voltage induced by different current patterns. In this paper singular value decomposition is modified with a threshold to be used in the sensitivity theorem for reconstruction of EIT images. Two different parameters are added to the singular values according to a threshold. The method has a major impact on efficient solution of EIT to achieve improved image resolution. Computer simulation and experiments indicate that this method performs better than the previous truncated SVD without using the threshold in terms of reconstructed image resolution
Keywords :
bioelectric potentials; electric impedance imaging; image reconstruction; image resolution; medical image processing; singular value decomposition; electrical impedance tomography; image reconstruction; image resolution; internal resistivity distribution; measured boundary voltage; sensitivity theorem; singular value decomposition; Computer simulation; Conductivity; Current measurement; Electric variables measurement; Image reconstruction; Image resolution; Impedance measurement; Singular value decomposition; Tomography; Voltage measurement;
Conference_Titel :
Engineering in Medicine and Biology Society, 2005. IEEE-EMBS 2005. 27th Annual International Conference of the
Conference_Location :
Shanghai
Print_ISBN :
0-7803-8741-4
DOI :
10.1109/IEMBS.2005.1616713