DocumentCode :
1609402
Title :
Rigorous mathematical calculation of p- and n-mobility as functions of mechanical stress, electric field, current direction and substrate indices for scaled CMOS designing
Author :
Okada, Takako ; Yoshimura, Hisao
Author_Institution :
Corp. Res. Dev. Center, Toshiba Corp., Kawasaki, Japan
fYear :
2004
Firstpage :
116
Lastpage :
117
Abstract :
For quantitative understanding of mobility, scattering rate and effective mass in an anisotropic system of strained/unstrained silicon and germanium, we have developed a rigorous physical equation of Schrodinger base wave functions. Using the tool, we have first quantitatively demonstrated p- and n-mobility characteristics as functions of mechanical stress, electric field, current direction and substrate indices.
Keywords :
CMOS integrated circuits; Schrodinger equation; carrier mobility; integrated circuit design; stress effects; Schrodinger base wave functions; current direction; electric field; mathematical calculation; mechanical stress; n-mobility; p-mobility; scaled CMOS designing; substrate indices; Acoustic scattering; Anisotropic magnetoresistance; Capacitive sensors; Effective mass; Equations; Germanium; Silicon; Substrates; Tensile stress; Wave functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 2004. Digest of Technical Papers. 2004 Symposium on
Print_ISBN :
0-7803-8289-7
Type :
conf
DOI :
10.1109/VLSIT.2004.1345426
Filename :
1345426
Link To Document :
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