Title : 
Evaluation of a new low cost software level fault tolerance technique to cope with soft errors
         
        
            Author : 
Tarrillo, J.F. ; Lisboa, C.A. ; Carro, L. ; Argyrides, C. ; Pradhan, D.K.
         
        
            Author_Institution : 
Inst. de Inf., Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
         
        
        
        
        
            Abstract : 
Increasing soft error rates make the protection of combinational logic against transient faults in future technologies a major issue for the fault tolerance community. Since not every transient fault leads to an error at application level, software level fault tolerance has been proposed by several authors as a better approach. In this paper, a new software level technique to detect and correct errors due to transient faults is proposed and compared to a classic one, and the costs of detection and correction for both approaches are compared and discussed.
         
        
            Keywords : 
combinational circuits; error correction; fault tolerance; radiation hardening (electronics); combinational logic; error correction; soft error rates; software level fault tolerance; transient fault; DH-HEMTs; Encoding; Finite element methods; Polynomials; Software; Sorting; Transient analysis;
         
        
        
        
            Conference_Titel : 
Test Workshop (LATW), 2010 11th Latin American
         
        
            Conference_Location : 
Pule del Este
         
        
            Print_ISBN : 
978-1-4244-7786-9
         
        
            Electronic_ISBN : 
978-1-4244-7785-2
         
        
        
            DOI : 
10.1109/LATW.2010.5550371