DocumentCode :
1610561
Title :
Design of a high voltage pulse circuit for exciting ultrasonic transducers
Author :
Dingguo Xiao ; Jiameng Shao ; Huiling Ren ; Chunguang Xu
Author_Institution :
Key Lab. of Fundamental Sci. for Adv. Machining, Beijing Inst. of Technol., Beijing, China
fYear :
2013
Firstpage :
224
Lastpage :
230
Abstract :
Ultrasonic nondestructive testing with characters of fine resolution and low cost has well been developed and widely applied in modern industrial world. The generation of high voltage pulse to excite the transducer has been a critical challenge in an ultrasonic testing system. In this paper a DC/DC converting circuit with an input of 12V and an output of 300V and -300V independently is introduced, so is a pulse generator with pulse width configured by a FPGA with parameters transmitted through a PCI bus by VC++ program. With different connection of the circuit, a positive unipolar pulse, a negative unipolar pulse, a monocycle bipolar pulse and a 2-cycle bipolar pulse can be generated respectively. Finally some pulse characters which may influence the excitation of the ultrasonic transducer are analyzed, the spectrum signature of each type is presented in the later part of this paper.
Keywords :
DC-DC power convertors; field programmable gate arrays; pulse generators; ultrasonic materials testing; ultrasonic transducers; 2-cycle bipolar pulse; DC/DC converting circuit; FPGA; PCI bus; VC++ program; high voltage pulse circuit; monocycle bipolar pulse; negative unipolar pulse; positive unipolar pulse; pulse characters; pulse generator; pulse width; spectrum signature; ultrasonic nondestructive testing; ultrasonic transducers; voltage -300 V; voltage 12 V; voltage 300 V; Acoustics; DC-DC power converters; Field programmable gate arrays; MOSFET; Pulse generation; Transducers; Voltage control; DC/DC converter; high voltage pulse; spectrum signature; ultrasonic testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nondestructive Evaluation/Testing: New Technology & Application (FENDT), 2013 Far East Forum on
Conference_Location :
Jinan
Print_ISBN :
978-1-4673-6018-0
Type :
conf
DOI :
10.1109/FENDT.2013.6635562
Filename :
6635562
Link To Document :
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