• DocumentCode
    1610715
  • Title

    Robustness analysis of the FlexRay system through fault tree analysis

  • Author

    Leu, Kuen-Long ; Chen, Yung-Yuan ; Wey, Chin-Long ; Chen, Jwu-E

  • Author_Institution
    National Central University, Department of Electrical Engineering, No.300, Jhongda Rd., Jhongli City, Taoyuan County, Taiwan (R.O.C)
  • fYear
    2010
  • Firstpage
    30
  • Lastpage
    35
  • Abstract
    The increasing importance of FlexRay systems in automotive domain inspires unceasing relative researches. One primary issue among researches is to verify the robustness of FlexRay systems either from protocol aspect or from system design aspect. However, research rarely addresses the issue that network topology selection will also cause difference in robustness. In this paper, we will illustrate how to model the robustness under various network topology adoptions by a well-known technology, fault tree analysis (FTA). Quantitative and qualitative analysis results can show the potential and suitability of FTA for modeling FlexRay systems´ robustness.
  • Keywords
    Facsimile; Logic gates; Network topology; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Electronics and Safety (ICVES), 2010 IEEE International Conference on
  • Conference_Location
    QingDao, China
  • Print_ISBN
    978-1-4244-7124-9
  • Type

    conf

  • DOI
    10.1109/ICVES.2010.5550952
  • Filename
    5550952