• DocumentCode
    1611065
  • Title

    High temperature applications of Al wire connection to SiC structures

  • Author

    Kisiel, Ryszard ; Guziewicz, Marek

  • Author_Institution
    Inst. of Microelectron. & Optoelectron., Warsaw Univ. of Technol., Warsaw, Poland
  • fYear
    2008
  • Firstpage
    264
  • Lastpage
    268
  • Abstract
    Unique properties of SiC lead this semiconductor for applications in new electronic devices operating at high temperatures, high power and high frequencies. There are a few problems related to the production of high temperature SiC devices. Developing of reliable ohmic contacts to SiC structure as well as a wire connection between the SiC ohmic contact and package leads are the serious tasks for today. An investigation of properties of high temperature Al wire bonds between SiC and package leads was the aim of this work. Preliminary results of contacts resistance as well as the wire loop pull test show that Al-Al interconnection system can be use successfully up to 350degC.
  • Keywords
    aluminium; high-temperature electronics; ohmic contacts; silicon compounds; wide band gap semiconductors; electronic devices; high temperature devices; ohmic contacts; wire connection; Contact resistance; Electronics packaging; Frequency; Lead compounds; Ohmic contacts; Production; Semiconductor device packaging; Silicon carbide; Temperature; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology, 2008. ISSE '08. 31st International Spring Seminar on
  • Conference_Location
    Budapest
  • Print_ISBN
    978-1-4244-3972-0
  • Electronic_ISBN
    978-1-4244-3974-4
  • Type

    conf

  • DOI
    10.1109/ISSE.2008.5276581
  • Filename
    5276581