DocumentCode
1611065
Title
High temperature applications of Al wire connection to SiC structures
Author
Kisiel, Ryszard ; Guziewicz, Marek
Author_Institution
Inst. of Microelectron. & Optoelectron., Warsaw Univ. of Technol., Warsaw, Poland
fYear
2008
Firstpage
264
Lastpage
268
Abstract
Unique properties of SiC lead this semiconductor for applications in new electronic devices operating at high temperatures, high power and high frequencies. There are a few problems related to the production of high temperature SiC devices. Developing of reliable ohmic contacts to SiC structure as well as a wire connection between the SiC ohmic contact and package leads are the serious tasks for today. An investigation of properties of high temperature Al wire bonds between SiC and package leads was the aim of this work. Preliminary results of contacts resistance as well as the wire loop pull test show that Al-Al interconnection system can be use successfully up to 350degC.
Keywords
aluminium; high-temperature electronics; ohmic contacts; silicon compounds; wide band gap semiconductors; electronic devices; high temperature devices; ohmic contacts; wire connection; Contact resistance; Electronics packaging; Frequency; Lead compounds; Ohmic contacts; Production; Semiconductor device packaging; Silicon carbide; Temperature; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Technology, 2008. ISSE '08. 31st International Spring Seminar on
Conference_Location
Budapest
Print_ISBN
978-1-4244-3972-0
Electronic_ISBN
978-1-4244-3974-4
Type
conf
DOI
10.1109/ISSE.2008.5276581
Filename
5276581
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