Title :
Substituting Voas´s testability measure for Musa´s fault exposure ratio
Author :
Voas, Jeffrey M. ; Miller, Keith W.
Author_Institution :
Reliable Software Technols., Sterling, VA, USA
Abstract :
This paper analyzes the relationship between Voas´s (1991) software testability measure and Musa´s (1987) fault exposure ratio, K. It has come to our attention that industrial users of Musa´s model employ his published, experimental value for K, 4.2×10-7, for their projects, instead of creating their own K estimate for the system whose reliability is being assessed. We provide a theoretical argument for how a slight modification to Voas´s formulae for determining a predicted minimal fault size can provide a predicted average fault size. The predicted average fault size can be used as a substitute for 4.2×10-7, and in our opinion is a more plausible choice for K
Keywords :
prediction theory; program testing; software reliability; Musa´s fault exposure ratio; Voas´s testability measure; experimental value; predicted average fault size; predicted minimal fault size; software testability measure; system reliability; Application software; Art; Communication industry; Particle measurements; Performance evaluation; Size measurement; Software measurement; Software systems; Software testing; Telecommunications;
Conference_Titel :
Communications, 1996. ICC '96, Conference Record, Converging Technologies for Tomorrow's Applications. 1996 IEEE International Conference on
Conference_Location :
Dallas, TX
Print_ISBN :
0-7803-3250-4
DOI :
10.1109/ICC.1996.542188