Title :
Wavelet energy-based Mahalanobis distance metric for testing analog and mixed-signal circuits
Author :
Dimopoulos, M.G. ; Spyronasios, A.D. ; Hatzopoulos, A.A.
Author_Institution :
Dept. of Electron., Alexander Technol. Educ. Inst. of Thessaloniki, Thessaloniki, Greece
Abstract :
In this paper a test method based on the wavelet transformation of the measured signal, be it supply current (IPS) or output voltage (VOUT) waveform, is presented. In the wavelet analysis, a Mahalanobis distance test metric is introduced utilizing information from the wavelet energies of the first decomposition level of the measured signal. The tolerance limit for the good circuit is set by statistical processing data obtained from the fault-free circuit. Simulation comparative results on a benchmark circuit for testing both hard faults and parametric faults are presented showing the effectiveness of the proposed testing scheme.
Keywords :
analogue integrated circuits; benchmark testing; integrated circuit testing; mixed analogue-digital integrated circuits; waveform analysis; wavelet transforms; Mahalanobis distance metric; analog circuit testing; benchmark circuit; benchmark testing; fault-free circuit; mixed-signal circuit testing; output voltage waveform; signal measurement; statistical data processing; supply current waveform; wavelet energy; wavelet transform; Circuit faults; Current measurement; Testing; Wavelet analysis; Wavelet transforms; Analog and Mixed Signal Testing; Circuit Testing; Mahalanobis Distance; Wavelets;
Conference_Titel :
Mixed Design of Integrated Circuits and Systems (MIXDES), 2010 Proceedings of the 17th International Conference
Conference_Location :
Warsaw
Print_ISBN :
978-1-4244-7011-2
Electronic_ISBN :
978-83-928756-4-2
