DocumentCode
161151
Title
PVT-variations-tolerant clock design using self-correcting adjustable delay buffers
Author
Wen-Pin Tu ; Shih-Hsu Huang ; Hsin-Heng Lu
Author_Institution
Dept. of Electron. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
fYear
2014
fDate
7-10 May 2014
Firstpage
1
Lastpage
2
Abstract
As the process technology scaling, the tolerance to PVT (process/ voltage/temperature) variation has become a serious concern. During the post-silicon stage, ADBs (adjustable delay buffers) can be used to adjust the delay of the clock path for eliminating the clock skew. However, in fact, unless that the clock tree has a self-correcting mechanism, the clock skew caused by PVT variations still cannot be properly controlled. In this paper, we propose the first self-correcting ADB system to control the clock skew during circuit execution. Experimental results show that our design methodology can achieve very good results.
Keywords
buffer circuits; clocks; logic design; sequential circuits; PVT-variation-tolerant clock design; circuit execution; clock path delay; clock skew elimination; clock tree; design methodology; first self-correcting ADB system; post-silicon stage; process technology scaling; process-voltage-temperature variation; self-correcting adjustable delay buffers; synchronous sequential circuits; Clocks; Computer architecture; Delays; Detectors; Minimization; Registers; Synchronization; Adjustable Delay Buffer; Clock Skew; PVT Variations; Reliability; Self-Correction;
fLanguage
English
Publisher
ieee
Conference_Titel
Next-Generation Electronics (ISNE), 2014 International Symposium on
Conference_Location
Kwei-Shan
Type
conf
DOI
10.1109/ISNE.2014.6839357
Filename
6839357
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