• DocumentCode
    161151
  • Title

    PVT-variations-tolerant clock design using self-correcting adjustable delay buffers

  • Author

    Wen-Pin Tu ; Shih-Hsu Huang ; Hsin-Heng Lu

  • Author_Institution
    Dept. of Electron. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
  • fYear
    2014
  • fDate
    7-10 May 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    As the process technology scaling, the tolerance to PVT (process/ voltage/temperature) variation has become a serious concern. During the post-silicon stage, ADBs (adjustable delay buffers) can be used to adjust the delay of the clock path for eliminating the clock skew. However, in fact, unless that the clock tree has a self-correcting mechanism, the clock skew caused by PVT variations still cannot be properly controlled. In this paper, we propose the first self-correcting ADB system to control the clock skew during circuit execution. Experimental results show that our design methodology can achieve very good results.
  • Keywords
    buffer circuits; clocks; logic design; sequential circuits; PVT-variation-tolerant clock design; circuit execution; clock path delay; clock skew elimination; clock tree; design methodology; first self-correcting ADB system; post-silicon stage; process technology scaling; process-voltage-temperature variation; self-correcting adjustable delay buffers; synchronous sequential circuits; Clocks; Computer architecture; Delays; Detectors; Minimization; Registers; Synchronization; Adjustable Delay Buffer; Clock Skew; PVT Variations; Reliability; Self-Correction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Next-Generation Electronics (ISNE), 2014 International Symposium on
  • Conference_Location
    Kwei-Shan
  • Type

    conf

  • DOI
    10.1109/ISNE.2014.6839357
  • Filename
    6839357