• DocumentCode
    1611562
  • Title

    Analysis of the effect of nonlinear input/output characteristics of digital integrated circuits on signal integrity

  • Author

    Zolog, Monica ; Pitica, Dan

  • Author_Institution
    Appl. Electron. Dept., Tech. Univ. of Cluj-Napoca, Cluj-Napoca, Romania
  • fYear
    2008
  • Firstpage
    604
  • Lastpage
    609
  • Abstract
    The paper studies the reflections of the signals transmitted over PCB traces in the case of nonlinear transmission line terminators. First, the features of the approach presented in (the case of constant terminators) are briefly recapitulated. Next, the improved simulator is presented. This last approach takes into consideration the input/output voltage-current characteristics of the digital circuits. This is necessary because in most of the cases, a nonlinear terminator terminates a transmission line having an input from any one of a plurality of logic types: emitter coupled logic (ECL), transistor logic (TTL), Schottky transistor logic (STTL), low power Schottky transistor transistor logic (LSTTL), complementary MOS (CMOS). Finally, we investigate the signals that appear on the track. Nonlinear elements-in particular, digital integrated circuits having a continuous piecewise-linear voltage-current characteristic-are considered to be the terminations of the line.
  • Keywords
    digital integrated circuits; logic design; piecewise linear techniques; printed circuits; CMOS; PCB; Schottky transistor logic; continuous piecewise-linear voltage-current characteristic; digital integrated circuits; emitter coupled logic; logic types; low power Schottky transistor transistor logic complementary MOS; nonlinear terminator; signal integrity; transmission line; CMOS logic circuits; Circuit simulation; Digital circuits; Digital integrated circuits; Distributed parameter circuits; MOSFETs; Power transmission lines; Reflection; Signal analysis; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology, 2008. ISSE '08. 31st International Spring Seminar on
  • Conference_Location
    Budapest
  • Print_ISBN
    978-1-4244-3972-0
  • Electronic_ISBN
    978-1-4244-3974-4
  • Type

    conf

  • DOI
    10.1109/ISSE.2008.5276600
  • Filename
    5276600