DocumentCode
1611667
Title
Contents
fYear
2004
Abstract
Presents the table of contents of the proceedings.
Keywords
Dielectric breakdown; Electrons; Failure analysis; High-K gate dielectrics; Magnetic force microscopy; Microelectronics; Semiconductor device breakdown; Semiconductor device manufacture; Semiconductor device reliability; Sun;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the
Conference_Location
Taiwan
Print_ISBN
0-7803-8454-7
Type
conf
DOI
10.1109/IPFA.2004.1345513
Filename
1345513
Link To Document