• DocumentCode
    1611811
  • Title

    A Learning Approach to the Prediction of Reliability Ranking for Web Services

  • Author

    Wei Xiong ; Bing Li ; Xiaohui Cui ; Yutao Ma ; Rong Yang ; Peng He

  • Author_Institution
    State Key Lab. of Software Eng., Wuhan Univ., Wuhan, China
  • fYear
    2015
  • Firstpage
    169
  • Lastpage
    176
  • Abstract
    Service computing is a popular development paradigm in information technology. The functional properties of Web services assure correct functionality of cloud applications, while the nonfunctional properties such as reliability might significantly influence the user-perceived availability evaluation. Reliability rankings provide valuable information for making optimal cloud service selection from a set of functionally-equivalent candidate services. There existed several approaches that can conduct reliability ranking prediction for Web services. Those approaches acquire different rankings with different preference functions. It is arduous to determine whether there exists the best one in them, and what is the best one if not. This paper proposes a learning approach to reliability ranking prediction for Web services which utilizes past service invocation logs to train preference function. To validate the proposed approach, large-scale experiments are conducted based on a real-world Web service dataset, WSDream. The results show that our proposed approach achieves higher prediction accuracy than the existing approaches.
  • Keywords
    Web services; cloud computing; learning (artificial intelligence); WSDream; Web services; learning approach; optimal cloud service selection; past service invocation logs; preference function; reliability ranking prediction; service computing; user-perceived availability evaluation; Accuracy; Collaboration; Computational complexity; Software reliability; Training; Web services; Ranking Prediction; Reliability; SVM; Web Service;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Web Services (ICWS), 2015 IEEE International Conference on
  • Conference_Location
    New York, NY
  • Print_ISBN
    978-1-4673-7271-8
  • Type

    conf

  • DOI
    10.1109/ICWS.2015.32
  • Filename
    7195566