• DocumentCode
    1612084
  • Title

    Resolving inconsistencies in EFSM-modeled specifications

  • Author

    Uyar, M. Ümit ; Duale, Ali Y.

  • Author_Institution
    Dept. of Electr. Eng., City Coll. of New York, NY, USA
  • Volume
    1
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Firstpage
    135
  • Abstract
    The US Department of Defense requires that all digital ASIC systems used within the department´s branches should be specified in VHDL (very high speed integrated circuit hardware description language). VHDL specifications are typically modeled as extended finite-state machines (EFSMs). Developing efficient algorithms for EFSM models to generate feasible test sequences with acceptable lengths is a challenging task partly because of the inconsistencies among the actions and the conditions. Inconsistency detection algorithms for EFSM models have been developed at the earlier stages of this study. As part of realizable test sequence generation for VHDL specifications, this paper presents algorithms for the removal of inconsistencies in EFSM models. The proposed method allows the direct application of the FSM-based test generation methods by transforming the EFSM models into equivalent FSMs while avoiding the well-known state explosion problem, where possible. The inconsistency detection and removal algorithms are planned to be applied to the communication protocols used within US Army CECOM and NATO
  • Keywords
    application specific integrated circuits; finite state machines; formal specification; hardware description languages; military communication; military equipment; protocols; sequences; CECOM; DoD; EFSM models; EFSM-modeled specifications; FSM-based test generation methods; NATO; US Army; US Department of Defense; VHDL specifications; communication protocols; digital ASIC systems; efficient algorithms; extended finite-state machines; inconsistencies resolution; inconsistency detection algorithm; inconsistency removal algorithm; state explosion problem; test sequence generation; Application specific integrated circuits; Circuit testing; Cities and towns; Educational institutions; Explosions; Hardware design languages; Laboratories; Power system modeling; Protocols; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Military Communications Conference Proceedings, 1999. MILCOM 1999. IEEE
  • Conference_Location
    Atlantic City, NJ
  • Print_ISBN
    0-7803-5538-5
  • Type

    conf

  • DOI
    10.1109/MILCOM.1999.822658
  • Filename
    822658