Title :
A low-voltage MOSFET with small on-resistance: an extended characterization in high-efficiency power converter applications
Author :
Belverde, G. ; Guastella, C. ; Melito, M. ; Musumeci, S. ; Raciti, A.
Author_Institution :
STMicroelectronics, Catania, Italy
Abstract :
The paper deals with a new concept applied in designing low-voltage power MOSFETs, which are suitable for high-current low-voltage converter applications, The layout of the proposed device family overcomes the traditional cell structure by a new strip-based geometry. The authors present interesting characteristics due to the advanced design rules typical of VLSI processes and strong reduction of the on state resistance. Further, the technology process allows a significant simplification of the silicon fabrication steps, thus allowing enhancing of the device ruggedness. The high current handling in switching conditions (up to 150 A) with a breakdown voltage in the range between 20-50 V in a convenient package solutions allow to give the correct answers to the low-voltage range switch applications. The paper starts with the description of the main technology issues in comparison with that of standard devices, particularly focusing on the innovations and the improved performances. Moreover a detailed characterization of the MOSFET behavior in traditional test circuit as well as in an actual AC motor drive for wheelchair applications is presented and discussed.
Keywords :
field effect transistor switches; power MOSFET; power convertors; power semiconductor switches; semiconductor device measurement; semiconductor device testing; switching circuits; 150 A; 20 to 50 V; AC motor drive; Si; VLSI processes; breakdown voltage; characterization; current handling; device family layout; device ruggedness; high-current low-voltage converter; high-efficiency power converter applications; low-voltage power MOSFETs design; low-voltage range switch applications; on-state resistance reduction; silicon fabrication steps; strip-based geometry; switching conditions; test circuit; wheel chair applications; Circuit testing; Fabrication; Geometry; MOSFET circuits; Packaging; Paper technology; Power MOSFET; Silicon; Switches; Very large scale integration;
Conference_Titel :
Industry Applications Conference, 2001. Thirty-Sixth IAS Annual Meeting. Conference Record of the 2001 IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-7114-3
DOI :
10.1109/IAS.2001.955486