• DocumentCode
    1612916
  • Title

    Minimization of reverse recovery effects in hard-switched inverters using CoolMOS power switches

  • Author

    Kim, Hongrae ; Jahns, Thomas M. ; Venkataramanan, Giri

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
  • Volume
    1
  • fYear
    2001
  • Firstpage
    641
  • Abstract
    CoolMOS power switches offer appealingly low forward voltage drops in switching power converter applications up to 800 V, but the poor reverse recovery characteristics of their internal body diodes makes them difficult to use in hard-switching applications. A new technique based on synchronous rectification concepts, referred to as active channel freewheeling, is introduced as a promising approach for minimizing the diode reverse recovery effects. According to this approach, the reverse-conducting MOSFET channel is used to shunt the freewheeling current away from the body diode by gating the CoolMOS switches throughout their freewheeling intervals. Both simulation and experimental results are provided to explore the beneficial impact of this approach on the inverter´s turn-on switching losses and peak device currents. The impacts of device terminal characteristics, temperature, and gating dead time on technique effectiveness are also examined.
  • Keywords
    DC-AC power convertors; field effect transistor switches; invertors; minimisation; power MOSFET; power semiconductor switches; switching circuits; CoolMOS power switches; active channel freewheeling; device terminal characteristics; diode reverse recovery; forward voltage drop; freewheeling current shunting; gating dead time; hard-switched inverters; internal body diodes; peak device currents; reverse recovery effects minimisation; reverse-conducting MOSFET channel; switching power converter; synchronous rectification concepts; temperature; turn-on switching losses; Diodes; Insulated gate bipolar transistors; Inverters; Leg; Low voltage; MOSFET circuits; Power MOSFET; Switches; Switching loss; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2001. Thirty-Sixth IAS Annual Meeting. Conference Record of the 2001 IEEE
  • Conference_Location
    Chicago, IL, USA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-7114-3
  • Type

    conf

  • DOI
    10.1109/IAS.2001.955487
  • Filename
    955487