• DocumentCode
    1612997
  • Title

    A new low voltage linearization technique employing plurality of CCII coupled pairs

  • Author

    Bozomitu, Radu Gabriel ; Cehan, Vlad

  • Author_Institution
    Dept. of Telecommun., Gh. Asachi Tech. Univ., Iasi, Romania
  • fYear
    2008
  • Firstpage
    318
  • Lastpage
    323
  • Abstract
    In this paper a new highly linear transconductor consisting of N second order current conveyors (CCII) coupled pairs with linearization resistors was designed for low-voltage operation. By applying variable offset voltages to these CCII coupled pairs, the linearity of the resulted transconductor can be substantially improved. We show that the type and the dynamic range of the obtained transconductor depend on the value of linearization resistors that are used. Thus, depending on the value of the linearization resistors used, a ldquotanhrdquo type behavior transconductor can be obtained, for which the linear input range is inversely proportional to gain or a ldquosinhrdquo type behavior, for which the linear input range is directly proportional to gain. This represents an advantage for various applications in the field of communications. The simulations performed in 0.18 mum bipolar technology confirm the theoretical results.
  • Keywords
    current conveyors; linearisation techniques; low-power electronics; CCII coupled pair; bipolar technology; linearization resistor; low voltage linearization technique; second order current conveyors; sinh type behavior transconductor; size 0.18 mum; tanh type behavior transconductor; Dynamic range; Electronics packaging; Linearity; Linearization techniques; Low voltage; Resistors; System-on-a-chip; Transconductance; Transconductors; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology, 2008. ISSE '08. 31st International Spring Seminar on
  • Conference_Location
    Budapest
  • Print_ISBN
    978-1-4244-3972-0
  • Electronic_ISBN
    978-1-4244-3974-4
  • Type

    conf

  • DOI
    10.1109/ISSE.2008.5276660
  • Filename
    5276660