Title :
Capacitance and RF-conductance/transconductance look-up table based pHEMT model
Author :
Wei, Ce-Jun ; Zhu, Yu ; Yin, Hong ; Klimashov, Oleksiy ; Zhang, Cindy ; Lee, Tzung-Yin
Author_Institution :
Skyworks Solution Inc., Woburn, MA, USA
Abstract :
A capacitance and RF-conductance/RF-transconductance look-up table based large-signal pHEMT model is presented based on an ensemble of bias-dependent small-signal equivalent circuits. The model is capable of accurate simulation of small-signal S-parameters as well as large-signal performance over the data-acquisition bias range. In addition to the dc current sources, the model contains two capacitive current sources and two dynamic RF current sources, which fit RF-DS conductance and transconductance respectively. By introducing the dynamic RF current sources, the problem of path-dependence which occurs in modeling large-size devices and devices with dispersion is resolved. The model is symmetric and swappable between drain and source. The model has also accurate leakage model and can be used for either amplifier or switch applications. The validity of the model is demonstrated by comparing the simulation of DC curves, leakages, and small-signal S-parameters over a wide bias range, by comparison of the measured data. Large-signal power/harmonics simulation shows good comparison to the measured data.
Keywords :
capacitance; constant current sources; data acquisition; electric admittance; equivalent circuits; high electron mobility transistors; leakage currents; semiconductor device models; RF-DS conductance; RF-DS transconductance; RF-conductance look-up table; RF-transconductance look-up table; amplifier applications; bias-dependent small-signal equivalent circuit; capacitance look-up table; capacitive current sources; data acquisition bias range; dc current sources; dynamic RF current sources; large-signal harmonics simulation; large-signal pHEMT model; large-signal power simulation; leakage model; path-dependence problem; small-signal S-parameter simulation; switch applications; symmetric model; Capacitance; Current measurement; Integrated circuit modeling; Mathematical model; PHEMTs; Radio frequency; Table lookup; Emote PHEMT; look-up table modeling;
Conference_Titel :
Microwave Conference Proceedings (APMC), 2011 Asia-Pacific
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-4577-2034-5