• DocumentCode
    1613079
  • Title

    Access to microsystem technology: the CMP services solution

  • Author

    Charlot, B. ; Courtois, B. ; Delori, H. ; Paillotin, J.-F. ; Torki, K.

  • Author_Institution
    CMP, Grenoble, France
  • Volume
    1
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    47
  • Abstract
    CMP aims at providing Universities, Research Laboratories and Industries with the possibility to have their integrated circuits projects fabricated for prototyping and low volume production. Presently, users are serviced for CMOS double layer poly/double layer metal (DLP/DLM) 0.8 μ, DLM/TLM 0.6 μ, DLP/4LM 0.35 μ, SLP/6LM 0.18 μ and 0.12 μ, BiCMOS DLP/DLM 0.8 μ, SiGe BiCMOS DLP/DLM 0.8 μ and 5 LM 0.35 μ, and HEMT GaAs 0.2 μ. About 40 multi-project runs are offered per year. Micro Electro Mechanical Systems (MEMS) are provided in standard CMP runs in CMOS DLP/DLM 0.8 μm and DLM/TLM 0.6 μ, BiCMOS DLP/DLM 0.8 μ and HEMT GaAs 0.2 μ, using compatible front-side bulk micro-machining. MUMPS process is offered as a surface micro-machining allowing one to integrate MEMS only microstructures. This paper describes the services available, focusing on the most advanced IC processes and on the MEMS processes.
  • Keywords
    BiCMOS integrated circuits; CMOS integrated circuits; HEMT integrated circuits; integrated circuit metallisation; micromachining; micromechanical devices; semiconductor device metallisation; 0.12 micron; 0.18 micron; 0.2 micron; 0.35 micron; 0.6 micron; 0.8 micron; 5LM; BiCMOS; CMOS; CMP services; DLM/TLM; DLP/DLM; GaAs; HEMT; MEMS; MUMPS; SLP/6LM; SiGe; double layer poly/double layer metal; front-side bulk micro-machining; integrated circuits projects; low volume production; microsystem technology; multi-project runs; prototyping; surface micro-machining; BiCMOS integrated circuits; CMOS technology; Educational institutions; Gallium arsenide; HEMTs; Integrated circuit technology; Laboratories; Micromechanical devices; Prototypes; Textile industry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2002. MIEL 2002. 23rd International Conference on
  • Print_ISBN
    0-7803-7235-2
  • Type

    conf

  • DOI
    10.1109/MIEL.2002.1003147
  • Filename
    1003147