Title :
Twenty years of ATE
Author :
Gosling, William
Author_Institution :
Plessey Co. Plc, Romsey, UK
Abstract :
The author surveys 20 years in the field of ATE (automatic test equipment) after the famous `Cherry Hill´ International Test Conference of 1970. The microelectronics revolution, the development of the microprocessor, and design for testability are highlighted
Keywords :
automatic test equipment; automatic testing; circuit CAD; integrated circuit testing; microcomputer applications; 1970 to 1990; ATE; CAD; Cherry Hill; IC testing; automatic test equipment; design for testability; microelectronics; microprocessor; Automatic control; Automatic programming; Circuit faults; Circuit testing; Computer peripherals; Consumer electronics; Electronic equipment testing; Microelectronics; Switches; System testing;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82270
