Title :
Using the Gouy phase to increase the sensitivity of electro-optic sampling
Author_Institution :
Inst. of Quantum Electron., ETH Zurich, Zurich, Switzerland
Abstract :
The sensitivity of electro-optic sampling of terahertz pulses may be doubled for beams of a finite size, since the terahertz field alters the probe beam diffraction and thus the Gouy phases of both polarisations differently.
Keywords :
high-speed optical techniques; light diffraction; Gouy phase; electro-optic sampling; probe beam diffraction; terahertz pulses; DH-HEMTs; Sampling methods;
Conference_Titel :
Photonics Society Winter Topicals Meeting Series (WTM), 2010 IEEE
Conference_Location :
Majorca
Print_ISBN :
978-1-4244-5240-8
Electronic_ISBN :
978-1-4244-5241-5
DOI :
10.1109/PHOTWTM.2010.5421986
