• DocumentCode
    1613179
  • Title

    Using the Gouy phase to increase the sensitivity of electro-optic sampling

  • Author

    Schneider, Arno

  • Author_Institution
    Inst. of Quantum Electron., ETH Zurich, Zurich, Switzerland
  • fYear
    2010
  • Firstpage
    26
  • Lastpage
    27
  • Abstract
    The sensitivity of electro-optic sampling of terahertz pulses may be doubled for beams of a finite size, since the terahertz field alters the probe beam diffraction and thus the Gouy phases of both polarisations differently.
  • Keywords
    high-speed optical techniques; light diffraction; Gouy phase; electro-optic sampling; probe beam diffraction; terahertz pulses; DH-HEMTs; Sampling methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics Society Winter Topicals Meeting Series (WTM), 2010 IEEE
  • Conference_Location
    Majorca
  • Print_ISBN
    978-1-4244-5240-8
  • Electronic_ISBN
    978-1-4244-5241-5
  • Type

    conf

  • DOI
    10.1109/PHOTWTM.2010.5421986
  • Filename
    5421986
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1613179