• DocumentCode
    1613209
  • Title

    Hierarchical testing using the IEEE Std 1149.5 module test and maintenance slave interface module

  • Author

    Hong, Jin-Hua ; Tsai, Chung-Hung ; Wu, Cheng-Wen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    1996
  • Firstpage
    50
  • Lastpage
    55
  • Abstract
    An IEEE Std 1149.5 MTM-Bus Slave interface module is presented, which is used for direct access to 1149.1 chip-level buses and hierarchical test. All the standard 1149.1 functions, such as SAMPLE/PRELOAD, EXTEST, BYPASS, and even RUNBIST, can be performed within three 1149.5 Read/Write-Data message cycles. The messages are transmitted between the MTM-bus Master module (M-module) and the Slave module (S-module). We adopt the Full TAP Control (FTC) method to activate the 1149.1 Boundary-Scan paths via the 1149.5 MTM-Bus. A personal computer is used as the M-module
  • Keywords
    IEEE standards; boundary scan testing; integrated circuit testing; maintenance engineering; modules; system buses; 1149.1 chip-level bus; BYPASS; EXTEST; Full TAP Control; IEEE Std 1149.5; MTM-Bus Slave interface module; Master module; RUNBIST; Read/Write-Data message cycle; SAMPLE/PRELOAD; Slave module; boundary-scan path; hierarchical testing; module test and maintenance slave interface module; personal computer; Backplanes; Circuit testing; Integrated circuit packaging; Logic testing; Master-slave; Microcomputers; Performance evaluation; Printed circuits; Protocols; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1996., Proceedings of the Fifth Asian
  • Conference_Location
    Hsinchu
  • ISSN
    1085-7735
  • Print_ISBN
    0-8186-7478-4
  • Type

    conf

  • DOI
    10.1109/ATS.1996.555136
  • Filename
    555136