Title :
Hierarchical testing using the IEEE Std 1149.5 module test and maintenance slave interface module
Author :
Hong, Jin-Hua ; Tsai, Chung-Hung ; Wu, Cheng-Wen
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
An IEEE Std 1149.5 MTM-Bus Slave interface module is presented, which is used for direct access to 1149.1 chip-level buses and hierarchical test. All the standard 1149.1 functions, such as SAMPLE/PRELOAD, EXTEST, BYPASS, and even RUNBIST, can be performed within three 1149.5 Read/Write-Data message cycles. The messages are transmitted between the MTM-bus Master module (M-module) and the Slave module (S-module). We adopt the Full TAP Control (FTC) method to activate the 1149.1 Boundary-Scan paths via the 1149.5 MTM-Bus. A personal computer is used as the M-module
Keywords :
IEEE standards; boundary scan testing; integrated circuit testing; maintenance engineering; modules; system buses; 1149.1 chip-level bus; BYPASS; EXTEST; Full TAP Control; IEEE Std 1149.5; MTM-Bus Slave interface module; Master module; RUNBIST; Read/Write-Data message cycle; SAMPLE/PRELOAD; Slave module; boundary-scan path; hierarchical testing; module test and maintenance slave interface module; personal computer; Backplanes; Circuit testing; Integrated circuit packaging; Logic testing; Master-slave; Microcomputers; Performance evaluation; Printed circuits; Protocols; System testing;
Conference_Titel :
Test Symposium, 1996., Proceedings of the Fifth Asian
Conference_Location :
Hsinchu
Print_ISBN :
0-8186-7478-4
DOI :
10.1109/ATS.1996.555136
