DocumentCode :
1613413
Title :
Diagnostics Package Used on the Sphinx Machine for Wire Array Z-Pinch Characterization
Author :
Zucchini, F. ; Calamy, H. ; Lassalle, F. ; Morell, A. ; Bedoch, J.P. ; Ritter, S. ; Maury, P.
Author_Institution :
Centre d ´´Etudes de Gramat, Gramat
fYear :
2007
Firstpage :
150
Lastpage :
150
Abstract :
Summary form only given. The Sphinx machine is based on the 1 microsecond LTD technology, and is used to implode nested aluminum wire arrays. Diagnostics have been continuously fielded and improved to characterize Z-pinch implosion, radiation pulse, generator behaviour as well as hohlraum results. Lines of sight consist of 16 radial lines of sight through apertures in the return current can, an axial through a 5 mm hole in the anode electrode, and a radial line of sight for hohlraum. Z-pinch imagine is done with a 2D Optical framing camera, a time resolved X-UV camera and two time integrated pinhole cameras with adapted set of filter for Al wire array. Two optical streak cameras (one coupled with a CCD detector) show the pinch implosion process. ID continuously time resolved camera, made of 16 X-UV diodes, is used to study zippering of the implosion. In order to study the X-ray pulse and the hohlraum temperature, vitreous carbon X-ray diodes (XRD), a set of filtered diamond photoconducting detector (PCD), and Bolometers (bare nickel and filtered gold bolometer, respectively, for total yield and kshell yield) are fielded on Sphinx. Spectroscopv data are obtained thanks to a time integrated spectrometer (KAP crystal) and on going a time resolved spectrometer filled with X-UV diodes. In addition for radiation effects measurement, piezoelectric quartz gauges and Visar interferometer are used. F.lectrical measurements are made with Rogowski coils and Bdot probes. On some shots, Bdot probes are installed on both electrodes between outer and inner array and inside inner array to obtain further information on the implosion process.
Keywords :
Z pinch; cameras; diodes; exploding wires; plasma X-ray sources; plasma diagnostics; 2D optical framing camera; Bdot probes; CCD detector; LTD technology; Rogowski coils; Sphinx machine; Visar interferometer; X-ray pulse; anode; bolometers; filtered diamond photoconducting detector; hohlraum; nested aluminum wire array implosion; optical streak camera; piezoelectric quartz gauges; plasma diagnostics package; radiation effects measurement; radiation pulse; time integrated pinhole cameras; time integrated spectrometer; time resolved X-UV camera; time resolved spectrometer; vitreous carbon X-ray diodes; wire array Z-pinch implosion; Bolometers; Cameras; Diodes; Electrodes; Optical arrays; Optical filters; Optical interferometry; Packaging machines; Spectroscopy; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
Conference_Location :
Albuquerque, NM
ISSN :
0730-9244
Print_ISBN :
978-1-4244-0915-0
Type :
conf
DOI :
10.1109/PPPS.2007.4345456
Filename :
4345456
Link To Document :
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