Title :
Large Format X-ray Pinhole Camera
Author :
Joseph, Nathan ; Wu, Ming ; Tibbitts, Aric ; Chandler, Gordon A.
Author_Institution :
Nat. Securitv Technol., Los Alamos
Abstract :
Summary form only given. National Security Technologies, LLC has successfully implemented many scientific and engineering innovations in the Large-Format Pinhole Camera (LFPHC), which have dramatically increased the detection sensitivity and reliability of the camera in exotic locations, such as the Sandia National Laboratories Z-facility. The LFPHC uses 40 x 76 mm microchannel plates that provide larger magnification capabilities for X-ray imaging. Improvements of the LFPHC have been demonstrated in its fielding at Z, where high-quality images were recorded. A major improvement was the development of a new, user-friendly LFPHC camera back that would tolerate high levels of radiation, electromagnetic interference, and mechanical shock. Key modifications resulted in improved detection sensitivity-, spatial resolution, uniformity along the microchannel plate strip, and stability of the interframe timing and delay. Design considerations and improvements are discussed.
Keywords :
X-ray imaging; image sensors; national security; National Security Technologies; Sandia National Laboratories Z-facility; X-ray imaging; camera reliability; detection sensitivity; electromagnetic interference; exotic locations; interframe timing stability; large format X-ray pinhole camera; mechanical shock; microchannel plate strip; Cameras; Electric shock; Electromagnetic interference; Electromagnetic radiation; Laboratories; Microchannel; National security; Reliability engineering; Technological innovation; X-ray imaging;
Conference_Titel :
Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
Conference_Location :
Albuquerque, NM
Print_ISBN :
978-1-4244-0915-0
DOI :
10.1109/PPPS.2007.4345459