DocumentCode :
1613461
Title :
Large Format X-ray Pinhole Camera
Author :
Joseph, Nathan ; Wu, Ming ; Tibbitts, Aric ; Chandler, Gordon A.
Author_Institution :
Nat. Securitv Technol., Los Alamos
fYear :
2007
Firstpage :
153
Lastpage :
153
Abstract :
Summary form only given. National Security Technologies, LLC has successfully implemented many scientific and engineering innovations in the Large-Format Pinhole Camera (LFPHC), which have dramatically increased the detection sensitivity and reliability of the camera in exotic locations, such as the Sandia National Laboratories Z-facility. The LFPHC uses 40 x 76 mm microchannel plates that provide larger magnification capabilities for X-ray imaging. Improvements of the LFPHC have been demonstrated in its fielding at Z, where high-quality images were recorded. A major improvement was the development of a new, user-friendly LFPHC camera back that would tolerate high levels of radiation, electromagnetic interference, and mechanical shock. Key modifications resulted in improved detection sensitivity-, spatial resolution, uniformity along the microchannel plate strip, and stability of the interframe timing and delay. Design considerations and improvements are discussed.
Keywords :
X-ray imaging; image sensors; national security; National Security Technologies; Sandia National Laboratories Z-facility; X-ray imaging; camera reliability; detection sensitivity; electromagnetic interference; exotic locations; interframe timing stability; large format X-ray pinhole camera; mechanical shock; microchannel plate strip; Cameras; Electric shock; Electromagnetic interference; Electromagnetic radiation; Laboratories; Microchannel; National security; Reliability engineering; Technological innovation; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
Conference_Location :
Albuquerque, NM
ISSN :
0730-9244
Print_ISBN :
978-1-4244-0915-0
Type :
conf
DOI :
10.1109/PPPS.2007.4345459
Filename :
4345459
Link To Document :
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