Title :
A model of low-frequency noise in ru-based low temperature sensors
Author_Institution :
Dept. of Electron. Fundamentals, Rzeszow Univ. of Technol.
Abstract :
The paper concerns low-frequency noise of RuO2 + glass temperature sensors at liquid helium temperatures. Recent experimental data which have revealed the increase of noise intensity with decreasing temperature are discussed on theoretical grounds. It is shown that neither weak localization nor hopping can provide an explanation of such a behavior. A model of conduction is proposed which takes into account the granular nature of the sensors
Keywords :
noise; ruthenium compounds; temperature sensors; RuO2; conduction model; hopping characteristic; liquid helium temperatures; low-frequency noise; noise intensity; temperature sensors; weak localization; Electrical resistance measurement; Frequency measurement; Glass; Low-frequency noise; Magnetic noise; Noise measurement; Resistors; Temperature sensors; Thick films; Voltage;
Conference_Titel :
Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005. 28th International Spring Seminar on
Conference_Location :
Wiener Neustadt
Print_ISBN :
0-7803-9325-2
DOI :
10.1109/ISSE.2005.1491051
