DocumentCode :
1613530
Title :
Recognition of fault transients using a probabilistic neural-network classifier
Author :
Perera, Nuwan ; Rajapakse, Athula
Author_Institution :
Univ. of Manitoba, Winnipeg, MB, Canada
fYear :
2011
Firstpage :
1
Lastpage :
1
Abstract :
Summary form only given. This paper investigates the applicability of decision tree, hidden Markov model, and probabilistic neural-network(PNN) classification techniques to distinguish the transients originating from the faults from those originating from normal switching events. Current waveforms due to different types of events, such as faults, load switching, and capacitor bank switching were generated using a high-voltage transmission system simulated in PSCAD/EMTDC simulation software. Simulated transients were used to train and test the classifiers offline. The wavelet energies calculated using three-phase currents were used as input features for the classifiers. The results of the study showed the potential for developing a highly reliable transient classification system using the PNN technique. An online classification model for PNN was fully implemented in PSCAD/EMTDC. This model was extensively tested under different scenarios. The effects of the fault impedance, signal noise, current-transformer saturation, and arcing faults were investigated. Finally, the operation of the classifier was verified using actual recorded waveforms obtained from a high-voltage transmission system.
Keywords :
decision trees; fault diagnosis; hidden Markov models; neural nets; pattern classification; power transmission faults; EMTDC simulation software; PNN technique; PSCAD simulation software; arcing fault; current waveform; current-transformer saturation; decision tree; fault impedance; fault transient; hidden Markov model; high-voltage transmission system; online classification model; probabilistic neural-network classifier; signal noise effect; switching event; three-phase current; transient classification system; wavelet energy; EMTDC; Hidden Markov models; PSCAD; Probabilistic logic; Software reliability; Switches; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power and Energy Society General Meeting, 2011 IEEE
Conference_Location :
San Diego, CA
ISSN :
1944-9925
Print_ISBN :
978-1-4577-1000-1
Electronic_ISBN :
1944-9925
Type :
conf
DOI :
10.1109/PES.2011.6038920
Filename :
6038920
Link To Document :
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