DocumentCode
1613757
Title
A combinatorial method for the evaluation of yield of fault-tolerant systems-on-chip
Author
Munteanu, Doru P. ; Sune, Victor ; Rodriguez-Montanes, Rosa ; Carrasco, Juan A.
Author_Institution
Military Technical Academy
fYear
2003
Firstpage
563
Lastpage
572
Keywords
Boolean functions; Data structures; Error correction; Fault tolerance; Fault tolerant systems; Intellectual property; Network-on-a-chip; System-on-a-chip; Virtual manufacturing; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Dependable Systems and Networks, 2003. Proceedings. 2003 International Conference on
Print_ISBN
0-7695-1952-0
Type
conf
DOI
10.1109/DSN.2003.1209966
Filename
1209966
Link To Document